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當(dāng)前位置:深圳市美瑞克電子科技有限公司>>數(shù)字示波器>>示波器探頭和附件>> P6243有源電壓探頭 泰克示波器探頭P6243

有源電壓探頭 泰克示波器探頭P6243

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  • 產(chǎn)品型號(hào):P6243
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  • 產(chǎn)品類別:電子儀表
  • 所在地:深圳市
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  • 更新時(shí)間:2023-02-18 11:48:06
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泰克示波器探頭P6243
提供Z廣泛的信號(hào)帶寬和更低的探頭負(fù)載,捕獲單端、地面參考信號(hào)。無(wú)源探測(cè)解決方案會(huì)帶來(lái)很大負(fù)載的小型幾何學(xué)應(yīng)用的Z理想選擇。

詳情介紹

泰克示波器探頭P6243 有源電壓探頭 優(yōu)勢(shì)供應(yīng)

P6245是美國(guó)Tektronix公司專為500M和500M以上示波器設(shè)計(jì)的、zui大可達(dá)1.5GHz有源FET探頭產(chǎn)品。該產(chǎn)品能夠滿足超過(guò)1GHz的帶寬的測(cè)試要求,能夠直接進(jìn)行間距大于0.5mm的SMD測(cè)試,特別適合于高速信號(hào)采集、低電路負(fù)載的測(cè)量場(chǎng)合。

   性能特點(diǎn):
   □ 精巧的探頭設(shè)計(jì),能夠直接進(jìn)行間隔大于0.5mm的SMD測(cè)試;
   □ 能進(jìn)行CMOS、BiCMOS、ECL、GaAS和TTL邏輯;
   □ 組合式結(jié)構(gòu):使用更加靈活,能夠適應(yīng)更多的測(cè)試場(chǎng)合;
   □ TekProbeTM BNC接口支持,能自動(dòng)被示波器識(shí)別,直接被示波器供電;
   □ 符合多種安全標(biāo)準(zhǔn):UL3111-1、CSA1010.1、ENG61010-2-031。

   技術(shù)參數(shù):
   □ 帶寬:1.5GHz(典型值,僅指探頭);
   □ 衰減比:10×;
   □ 輸入阻抗:輸入電阻=1MΩ,輸入電容<1pF;
   □ 補(bǔ)償電容:8~12Pf;
   □ zui大電壓:±15V(DC+PkAC);
   □ 直流補(bǔ)償范圍:10V;
   □ 傳輸延遲:5.3ns±200ps;
   □ 電纜長(zhǎng):1.3米;

   應(yīng)用領(lǐng)域
   □ 兼容的示波器產(chǎn)品:TDS3000、TDS3000B、TDS500、TDS600、TDS700;
   □ 高速數(shù)字電路設(shè)計(jì);
   □ 組件設(shè)計(jì)、分析;
   □ 教學(xué)研究;
   □ 生產(chǎn)制造、測(cè)試

P6245
  • ≥1.5 GHz Bandwidth (Typical, Probe Only)
  • ≤1 pF Input Capacitance
  • 1 MΩ Input Resistance
  • Direct Access to SMDs as Small as 0.5 mm Pitch
  • Measures CMOS, BiCMOS, ECL, GaAs and TTL Logic
P6243
  • 1 GHz Bandwidth (probe only)
  • ≤1 pF Input Capacitance
  • 1 MΩ Input Resistance
  • Direct Access to SMDs as Small as 0.5 mm Pitch
  • Measures CMOS, BiCMOS, ECL, GaAs and TTL Logic
  • Low Mass Probe Head/Cable
  • No Additional Power Supplies or Cables Are Required with TEKPROBE™ BNC Interface

Applications

  • High-speed Digital Systems Design
  • Component Design/Characterization
  • Manufacturing Engineering and Test
  • Educational Research

P6245 and P6243 Active Probes for TEKPROBE BNC Interfaces

P6245

The P6245 Active FET probe achieves high-speed signal acquisition by solving three traditional problems:

  • Lower DUT loading (≤1 pF/1 MΩ probe loading)
  • Direct and easy access to SMDs
  • Access DUT signals and scope bandwidth for TDS600/700/3000/5000/6000/70001 and CSA7000 scopes up to 1 GHz bandwidths

The P6245 and P6243 Active probes provide the electrical and mechanical performance required for today's digital systems designs. No additional power supplies or cables are required when used with TEKPROBE BNC oscilloscopes. Both the P6245 and P6243 achieve high-speed signal acquisition and low circuit loading, required for solving today's problems faced by designers.

The small compact probe head and versatile attachment accessories allow direct connection to the device under test.

The P6245 and P6243 Active Probes provide scope bandwidth at the probe tip for the TDS500/600/700; the P6243 provides scope bandwidth at the probe tip for the TDS3000 Series scope up to 1 GHz bandwidth.

1 Some TDS6000 or TDS7000 oscilloscopes require a TCA-BNC adapter.

P6243

The P6243 Active FET probe is the high performance probing solution for 500 MHz oscilloscopes. The P6243 has a probe only bandwidth of 1 GHz and will provide a 500 MHz system bandwidth when used with Tektronix' full line of 500 MHz oscilloscopes. In addition, the P6243 is powered by the TEKPROBE BNC interface, eliminating the need for additional power supplies and cables when used with TEKPROBE BNC oscilloscopes.

The P6243 offers superior signal acquisition on surface mount devices compared to the much higher capacitive loading of passive probes. The P6243 has ≤1 pF capacitive loading which allows it to measure high speed signals without affecting the signal or device under test. Furthermore, the included accessories and adapters allow for easy attachment to SMDs.

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